Variance thresholded EMD-CCA technique for fast eye blink artifacts removal in EEG Conference Paper

http://dx.doi.org/10.1109/tencon.2017.8228293

authors

Egambaram, Ashvaany
Badruddin, Nasreen Binti
Asirvadam, Vijanth Sagayan A/L
Begum, Tahamina
Fauvet, Eric
Stolz, Christophe

publication date

2017

Digital Object Identifier (DOI)

https://doi.org/10.1109/tencon.2017.8228293