IEICE Transactions on Information and Systems Journal

publication venue for

NoC-Compatible Wrapper Design and Optimization under Channel-Bandwidth and Test-Time Constraints. E91-D:2008-2017. 2008
On NoC Bandwidth Sharing for the Optimization of Area Cost and Test Application Time. E91-D:1999-2007. 2008
Scheduling Power-Constrained Tests through the SoC Functional Bus. E91-D:736-746. 2008

publisher

Institute of Electronics, Information and Communications Engineers (IEICE) Publisher

International Standard Serial Number (ISSN)

0916-8532
1745-1361