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Frequent pattern-based outlier detection measurements: A survey
Conference Paper
http://dx.doi.org/10.1109/icriis.2011.6125705
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authors
Said, Aiman Moyaid
Dominic Panneer Selvam, Dhanapal Durai
Samir, Brahim Belhaouari
publication date
2011
Identity
Digital Object Identifier (DOI)
https://doi.org/10.1109/icriis.2011.6125705
