Fault-tolerance and noise modelling in nanoscale circuit design Conference Paper

http://dx.doi.org/10.1109/issse.2010.5606936

authors

Anwer, Jahanzeb
Fayyaz, Ahmad
Masud, Muhammad M
Shaukat, Saleem F
Khalid, Usman
Hamid, Nor Hisham bin

publication date

2010

Digital Object Identifier (DOI)

https://doi.org/10.1109/issse.2010.5606936