IEEE Transactions on Very Large Scale Integration (VLSI) Systems Journal

publication venue for

Resistive Open Faults Detectability Analysis and Implications for Testing Low Power Nanometric ICs. 23:580-583. 2015
Multivoltage Aware Resistive Open Fault Model. 22:220-231. 2014

publisher

Institute of Electrical and Electronics Engineers (IEEE) Publisher

International Standard Serial Number (ISSN)

1063-8210
1557-9999