A Novel Error-Detection Mechanism for Digital Circuits Using Markov Random Field Modelling Conference Paper

http://dx.doi.org/10.1109/cicn.2012.30

authors

Anwer, Jahanzeb
Khalid, Usman
Singh, Narinderjit
Hamid, Nor Hisham bin
Asirvadam, Vijanth Sagayan A/L

publication date

2012

Digital Object Identifier (DOI)

https://doi.org/10.1109/cicn.2012.30