selected publications
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academic article
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Simulation study of single event effects sensitivity on commercial power MOSFET with single heavy ion radiation.
Bulletin of Electrical Engineering and Informatics.
8:1260-1267.
2019
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Simulation study of single event effects sensitivity on commercial power MOSFET with single heavy ion radiation.
Bulletin of Electrical Engineering and Informatics.
8:1260-1267.
2019
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